NEX DE VS Energy Dispersive X-ray Fluorescence Spectrometer

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Variable Small Spot Plus Camera EDXRF for Elemental Analysis

NEX DE VS

Features:
  • Analyze sodium to uranium non-destructively
  • Powerful QuantEZ software
  • High-resolution camera
  • 1, 3, or 10 mm analysis spot size
  • Solids, liquids, alloys, powders, and films
  • 60 kV X-ray tube for wide elemental coverage
  • FAST SDD detector for superior data
  • Six automated tube filters
  • Unmatched performance-to-price ratio
  • Optional RPF-SQX fundamental parameters


NEX DE VS


Features:
  • Analyze sodium to uranium non-destructively
  • Powerful QuantEZ software
  • High-resolution camera
  • 1, 3, or 10 mm analysis spot size
  • Solids, liquids, alloys, powders, and films
  • 60 kV X-ray tube for wide elemental coverage
  • FAST SDD detector for superior data
  • Six automated tube filters
  • Unmatched performance-to-price ratio
  • Optional RPF-SQX fundamental parameters


As a premium high-performance, SMALL SPOT benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the Rigaku NEX DE VS delivers wide elemental coverage with easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, slurries, and RoHS materials.




Multi-position, Small Spot & Bulk Elemental Analysis

Rigaku NEX DE VS elemental analyzer (EDXRF) offers multi-position bulk analysis in addition to a large single position sample stage, with three analysis spot size options — 1 mm, 3 mm, and 10 mm — that are easily changeable by the system's automatic collimators. A high-resolution camera and LED lighting system allow a sample's image to be recorded via the Windows software interface.

XRF Elemental Analysis in the Field, Plant, or Lab

Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility, and ease-of-use of the NEX DE VS adds to its broad appeal for an ever-expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants – such as analytical quality control (AQC), quality assurance (QA), or statistical process control like Six Sigma – the NEX DE VS is the reliable high-performance choice for routine elemental analysis by XRF.

XRF with 60 kV X-ray Tube and SDD Detector

The 60 kV X-ray tube and Peltier cooled FAST SDD® silicon drift detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), along with high emission current and multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

XRF Options: Autosampler, Helium and Standardless FP

Options include fundamental parameters, a variety of automatic sample changers, sample spinner, and helium purge for enhanced light element sensitivity.



FAST SDD is a registered trademark of Amptek, Inc.
Windows is a registered trademark of Microsoft Corporation in the United States and other countries.




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