High-performance Benchtop EDXRF Analyzer

Key Advantages & Features

The Rigaku NEX DE is a high-performance, direct excitation energy dispersive X-ray fluorescence (EDXRF) spectrometer that provides rapid, non-destructive qualitative and quantitative elemental analysis of sodium (Na) to uranium (U). It serves a broad range of applications and is an ideal tool for measuring low ppm levels up to high weight percent concentrations. NEX DE delivers high-performance results when analysis time or sample throughput is critical.

  • Non-destructive analysis of sodium to uranium
  • Powerful, easy-to-use QuantEZ software
  • Solids, liquids, alloys, powders, and films
  • 60 kV 12 W X-ray tube for wide elemental coverage
  • High-performance SDD for superior data
  • Low cost of ownership backed by a 2-year warranty
  • Optional RPF-SQX Fundamental Parameters software
  • NEX DE VS model offers small spot measurements

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Additional Notes

High-performance Elemental Analysis in the Field, Plant, or Lab

Specially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility, and ease of use of the NEX DE add to its broad appeal for an ever-expanding range of applications, including exploration, research, education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA), or statistical process control like Six Sigma — the NEX DE is the reliable, high-performance choice for routine elemental analysis.

60 kV X-ray Tube and SDD 

The 60 kV X-ray tube and Peltier-cooled silicon drift detector (SDD) deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), high emission current, and multiple automated X-ray tube filters provide a wide range of XRF applications versatility and low limits-of-detection (LOD).

Optional Autosamplers, Vacuum, Helium, and Standardless FP

Options include fundamental parameters, a variety of automatic sample changers, a sample spinner, and a helium purge or vacuum atmosphere for enhanced light element sensitivity.

Contact us for more information about NEX DE.

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