NEX DE Energy Dispersive X-ray Fluorescence Spectrometer

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Rapid EDXRF Elemental Analysis with Powerful QuantEZ Software

NEX DE

Features:
  • Analyze sodium to uranium non-destructively
  • Powerful QuantEZ Windows-based software
  • Solids, liquids, alloys, powders, and films
  • 60 kV X-ray tube for wide elemental coverage
  • FAST SDD detector for superior data
  • Six automated tube filters
  • Unmatched performance-to-price ratio
  • Optional RPF-SQX fundamental parameters


NEX DE


Features:
  • Analyze sodium to uranium non-destructively
  • Powerful QuantEZ Windows-based software
  • Solids, liquids, alloys, powders, and films
  • 60 kV X-ray tube for wide elemental coverage
  • FAST SDD detector for superior data
  • Six automated tube filters
  • Unmatched performance-to-price ratio
  • Optional RPF-SQX fundamental parameters


As a premium high-performance benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the Rigaku NEX DE delivers wide elemental coverage with easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, and slurries.



XRF Elemental Analysis in the Field, Plant, or Lab

Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility, and ease-of-use of the NEX DE add to its broad appeal for an ever-expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants – such as analytical quality control (AQC), quality assurance (QA), or statistical process control like Six Sigma – the NEX DE is the reliable high-performance choice for routine elemental analysis by XRF.

XRF with 60 kV X-ray Tube and SDD Detector

The 60 kV X-ray tube and Peltier cooled FAST SDD® silicon drift detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), along with high emission current and multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

XRF Options: Autosampler, Vacuum, Helium, and Standardless FP

Options include fundamental parameters, a variety of automatic sample changers, sample spinner, and helium purge or vacuum atmosphere for enhanced light element sensitivity.



FAST SDD is a registered trademark of Amptek, Inc.
Windows is a registered trademark of Microsoft Corporation in the United States and other countries.


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