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NEX QC
Rigaku NEX QC low cost EDXRF elemental analyzer
 

Since 1951, Rigaku has been at the forefront of analytical and industrial instrumentation technology. Rigaku and its subsidiaries form a global group focused on life sciences and general purpose analytical instrumentation. With hundreds of major innovations to its credit, Rigaku and its subsidiary companies are world leaders in the fields of small molecule and protein crystallography, X-ray spectrometry and diffraction, X-ray optics, as well as semiconductor metrology. Rigaku employs over 1,100 people globally.

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EDXRF / XRF for Semiconductors & Magnetic Media

Thickness and elemental composition of multi-layer thin films





Wafer Film Application Note



Rigaku NEX CG EDXRF
Rigaku NEX CG Benchtop EDXRF
 

Semiconductor device fabrication is the process used to create the integrated circuits (silicon chips) that are present in everyday electrical and electronic devices. It is a multiple-step sequence of photographic and chemical processing steps during which electronic circuits are gradually created on a wafer made of pure semiconducting material. Silicon is the most commonly used semiconductor material today, along with various compound semiconductors. The entire manufacturing process, from start to packaged chips ready for shipment, takes six to eight weeks and is performed in highly specialized facilitiy known as a FAB.

Magnetic memory is an engineering term referring to the storage of computer, audio or video data and is a form of non-volatile memory. Information is typically accessed using one or more read/write heads.

Thickness & composition without standards 

The Rigaku NEX CG EDXRF is powered by a new qualitative and quantitative analytical software, RPF-SQX, that features Rigaku Profile Fitting (RPF) technology. The software allows semi-quantitative analysis of almost all sample types without standards—and rigorous quantitative analysis with standards.

Layer thickness and chemical composition of multilayer samples can be easily determined with energy dispersive X-ray fluorescence analysis (EDXRF), of thin films down to several atomic layers (less than 1nm) and up to the µm or even mm-range. The full Rigaku RPF-SQX fundamental parameters approach may be employed for all calculations and without the use of standards, i.e., no specific multilayer standards are required. Nevertheless any available multilayer standard can be used to optimize the results.

Semiconductor information and resources



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